Sam is an intellectual property trial lawyer who helps clients navigate high-stakes technology disputes in courts and administrative tribunals nationwide with a focus on patent litigation and PTAB proceedings.
Sam has extensive experience litigating complex technology matters from pre-suit investigation through trial and appeal. He has played leading roles in all phases of patent litigation, including fact and expert discovery, claim construction, dispositive motions, trial preparation, jury trials and Federal Circuit appeals. He has examined witnesses at trial, argued dispositive motions and presented oral argument before the Patent Trial and Appeal Board. Sam works closely with clients, technical experts and trial teams to develop case strategy and communicate complex technologies to judges, juries and administrative tribunals. Sam’s insights have contributed to multiple nine-figure outcomes for his clients.
His experience spans a broad range of technologies, including semiconductor fabrication processes, LED and LCD display technologies, computer hardware and software, wireless communications, optical and X-ray imaging and medical devices. Drawing on his Ph.D. in astrophysics, Sam frequently works with highly technical subject matter and scientific experts in patent disputes involving cutting-edge technologies. Clients value Sam's ability to translate complex technical issues into clear, persuasive arguments for decision-makers.
In addition to his litigation practice, Sam maintains an active pro bono practice focused on humanitarian immigration matters. He has represented asylum seekers in proceedings before U.S. immigration authorities, including helping secure asylum for a woman fleeing political violence in Cameroon and securing protected status for a family fleeing gang violence in Guatemala.
Sam holds Ph.D. and master’s degrees in astrophysics from the University of Chicago, where he also spent two years as a postdoctoral research fellow in radiology developing mathematical algorithms for image reconstruction in CT and MRI.
Publications
Samuel J. LaRoque, Reverse Engineering and Trade Secrets in the Post-Alice World, 66 U. Kan. L. Rev. 427 (2017).
S.J. LaRoque, E.Y. Sidky & X. Pan, Accurate Image Reconstruction from Few-View and Limited-Angle Data in Diffraction Tomography, J. Opt. Soc. Am. A 25, 1772 (2008).
Samuel J. LaRoque et al., X-Ray and Sunyaev-Zel’dovich Effect Measurements of the Gas Mass Fraction in Galaxy Clusters, The Astrophysical Journal 652, 917 (2006).